Support labs: Microscopy
This page collects the microscopy resources available to the users of MAX IV Laboratory.
Click on the relevant tile to get access to detailed information about available instrumentation, techniques, experiments, etc.
Click on the relevant tile to get access to detailed information about available instrumentation, techniques, experiments, etc.
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Scanning Tunneling Microscopy
STM, nc-AFM with atomic resolution (Omicron VT XA), experiments in UHV, atomically-clean surfaces
Atomic Force Microscopy
"Conventional" AFM, ambient environment, cleanroom, only topography measurements (Dimension 3100)
Scanning Electron Microscopy
SEM (FlexSEM 1000 ii) at NanoMAX beamline
We’d be grateful if you could fill in this short questionnaire to help us develop microscopy infrastructure at MAX IV.
Thank you!
Important dates
Call for proposals opens: 14 February 2022
Call for proposals closes: 14 March 2022
Access
Access to the VT UHV STM: primarily in conjunction with granted beamtime.
You should choose the STM-lab in DUO when submitting your proposal as an additional beamline:
For any inquiries, or if you would like to access the SPM-lab outside of granted beamtime projects, please contact Nikolay Vinogradov.
As of today, the access to the Dimension 3100 AFM and SEM@NanoMAX is more relaxed, but should you foresee that you might want to check your sample with AFM/SEM, please, add SPM-lab to the list of requested beamlines in your proposal!
Techniques available through open call
| Available for | Technique description |
|---|---|
| General Users, preferably in combination with a beamline proposal in research area spectroscopy | Scanning Tunneling Microscopy/Spectroscopy (STM/STS), dynamic STM with QPlus sensor, UHV. W or Pt/Ir(STM only) probes |
| General Users, preferably in combination with a beamline proposal in research area spectroscopy | Non-contact Atomic Force Microscopy (NC-AFM) with QPlus sensor, force curves, UHV |
| General Users, preferably in combination with a beamline proposal in research area spectroscopy | "Conventional" Atomic Force Microscopy (AFM) contact/tappng mode, in air |
| General Users, preferably in combination with a beamline proposal in research area spectroscopy | Scanning Electron Microscopy (SEM) at NanoMAX beamline |