Imaging lets you see what a material looks like from the outside or from within, even with nanometre resolution. It lets you probe both the exterior and interior structure of your material and see otherwise hidden components.
You can study how your material reacts at the nanostructure level upon external stimuli or in certain conditions, which can give you new insights into how you can develop better components.
Your results come in the shape of an image or film in two or more dimensions that looks like a photograph or an X-ray image with nanometre resolution.
Imaging techniques offered at MAX IV
A non-destructive technique used for constructing three-dimensional images from two-dimensional projections. It can let you characterize internal structures of porous materials or determine deviations inside components.
Photoemission Electron Microscopy (PEEM)
The PEEM microcope uses electron optics and combines high spatial resolution with high flux density to perform spatially resolved spectroscopy and topography.
Offered at beamlines: MAXPEEM
Soft Scanning Transmission Microscopy X-ray (SoftSTXM)
Provides spectroscopy and phase maps with soft, highly coherent X-ray beams on the nanometer (point probe) or micrometer (full field) scale. Used for time-dependent measurements of dynamics in samples and Fourier transform holography and X-ray resonant scattering.
Offered at beamlines: SoftiMAX
Uses a coherent X-ray beam to illuminate your sample and retrieve phase information from the far-field diffraction pattern with high spatial resolution.
Resonant Inelastic X-ray Scattering (RIXS)
A combination of X-ray Emission Spectroscopy and X-ray Absorption Spectroscopy, used for scanning incident and emitted energies and the difference between them. Lets you study fundamental excitations in correlated materials in detail, and resolve individual vibrational excitations in molecular systems.
Want to know more? Please contact us to see how we can help you in your research.