4th generation X-ray brilliance and nanoscale microscopy reveal clearest crystalline form
image: (left) 3D volume rendering (iso-surface) of crystalline Si-star with Bragg-ptychography, (center), atomic displacement along the z direction. The color map shows strain (dimensionless) (right) SEM image of the same Si-star sample, for comparison. Credit: Dina Carbone To capture extraordinary nanoscale details in crystallography takes the powerful coherent flux of a 4th generation light source.