The hard X-Ray nanoprobe of Max IV – NanoMAX – is designed to take full advantage of MAX IV’s exceptionally low emittance and the resulting coherence properties of the X-ray beam. The use of diffraction-limited optics will allow producing tightly focused coherent beams enabling imaging applications using diffraction, scattering, fluorescence and other methods, at unprecedented resolution. With its two experimental stations designed to offer, the first, the smallest focal spot, and the other, large flexibility at the expense of a larger focal spot for various scattering geometries, NanoMAX will offer exciting applications for a wide variety of research fields, such as materials science, life science, earth science, nanoscience, physics, chemistry and biology.

Available forTechnique description
General UserX-Ray Fluorescence; 2D maps at fixed angular position
General UserFar Field Ptychography
General UserCoherent X-ray diffraction
General UserAP-XPS at the solid-liquid and liquid-gas interfaces via use of dip-and-pull or liquid microjet methods in the electrochemical / liquid cell
General UserAP-XPS on catalytic and surface science type systems at mbar pressure range in the catalysis cell
General UserFTIR simultaneously with AP-XPS with the PM-IRRAS setup
General UserMacromolecular crystallography with XXX μm, at fixed energies of XX keV, automatic specimen handling, and data collection with an Eiger 16M detector at frame rates up to xxx Hz.
General UserRemote data collection for single crystals of 20 microns and up.


4th generation X-ray brilliance and nanoscale microscopy reveal clearest crystalline form

image: (left) 3D volume rendering (iso-surface) of crystalline Si-star with Bragg-ptychography, (center), atomic displacement along the z direction. The color map shows strain (dimensionless) (right) SEM image of the same Si-star sample, for comparison. Credit: Dina Carbone To capture extraordinary nanoscale details in crystallography takes the powerful coherent flux of a 4th generation light source.