Beamlines and techniques available for proposals
All users are strongly encouraged to contact beamline staff and discuss their proposal before submission.
Balder
Primary beamline contact: Konstantin Klementiev and Kajsa Sigfridsson Clauss
Available for | Technique description |
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General Users | X-ray Absorption Spectroscopy (XANES and EXAFS) in transmission, continuous scanning down to 30 sec/EXAFS |
General Users | X-ray Absorption Spectroscopy (XANES and EXAFS) in fluorescence with 7 element SDD /Ge, continuous scanning down to 30 sec/EXAFS |
General Users | X-ray Emission Spectroscopy (XES) with SCANIA-2D spectrometer |
BioMAX
Primary beamline contact: Ana Gonzalez
Available for | Technique description |
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General Users | Data collection at fixed energy between 6 and 24 keV, detector distance between 126 and 900 mm, beam focus of 20x5 microns, 50x50 microns or 100x100 microns and defining aperture of 5, 10, 20, 50 and 100 microns. |
General Users | Automated sample mounting and dismounting from UniPucks, 29 puck positions in dewar. |
General Users | Sample temperature 100 K; room temperature with or without humidity control available for manual mounting only. |
General Users | SAD and MAD experiments. |
General Users | Automated data integration, scaling and merging. Offline remote access for manual data processsing. |
General Users | Serial crystallography experiments using HVE-injector (High viscosity extrusion injector), fixed target scan using the MD3. Please contact beamline manager. |
General Users | Element identification by X-ray Fluorescence. |
General Users | Remote data collection. |
General Users | Fragment-based drug screening. Please contact beamline manager. |
See also BioMAX User Information |
Bloch
Primary beamline contact: Craig Polley
Available for | Technique description |
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General Users | High-resolution angle resolved photoelectron spectroscopy (ARPES), using deflection based analyzer or 6-axis manipulator. |
General Users | Linear vertical or horizontal polarised light from EPU, with energy range 10-1000eV (peak flux and resolution 15-200eV). |
General Users | Online Scanning tunneling microscopy (STM), 50K - 300K. |
Commissioning experts | Spin-resolved ARPES with a 3D-VLEED detector |
CoSAXS
Primary beamline contact: Tomás Plivelic
Available for | Technique description |
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General Users | SAXS, at 12.4 keV, q-range 1x10^-3 < q < 0.7 Å^-1. Contact BL staff for further details and see here. |
General Users | Laser triggered, temperature jump time-resolved SAXS (2 ms time-resolution), at 12.4 keV, q-range 1 x 10-3 to 0.5 Å-1 and ca. 1.5 to 2.3 Å-1. |
General Users | Solution and Bio-SAXS, with pipetting autoloader from 96 well plates, flow-through quartz capillary, in-line HPLC. |
General Users | Multiple capillary, multiple position solid sample holders, with thermostatic water bath; Linkam heating stage with liquid nitrogen cooling pump. |
General Users | SAXS/WAXS, at 12.4 keV, q-range 1 x 10-3 to 2.0 Å-1, contact BL staff for further details |
General Users | Microfluidic sample environment, discuss with BL staff |
DanMAX
Primary beamline contact: DanMAX contacts
Available for | Technique description |
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General Users | Powder X-ray diffraction (PXRD) in Debye-Scherrer geometry using 2D area detector in the energy range from 15-35 keV. |
General Users | PXRD: Sample temperature from 90 - 500 K and RT - 1000 K |
General Users | PXRD: With sample environment from DanMAX portfolio - see DanMAX sample environment |
General Users | 2D µPXRD and µXRF mapping using continuous and step scans. |
General Users | XRD-CT |
General Users | Total scattering, SDD~95mm, E=35 keV, Qmax~20Å^1. |
General Users | PXRD: Stand-alone sample user-designed environments. Only pre-approved equipment – contact beamline staff. |
Commissioning Experts | Imaging: contact beamline staff. |
FemtoMAX
Primary beamline contact: Jörgen Larsson
Available for | Technique description |
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General Users | Scattering set-up (SAXS, WAXS) Air or He-environment |
General Users | Scattering set-up (in vacuum). Limited scattering range +/-10 degrees horisontal 0-40 degrees vertical Vacuum better than 1E-7 mBar; 2E-6 with Pilatus connected to vacuum; Cryocooling 40K for grazing incidence samples Tilt range +/- 0.5 degrees Wedges available on request to match Bragg angle. No cryocooling with wedges. |
General Users | Tilt platform 0-15 degrees (wedges available on request) Air +/-20 mm translation range Cryostream for LN2 available (performance untested) |
General Users | Life-time measurement by visible fluorescence detection following X-ray excitation |
FinEstBeAMS
Primary beamline contact: Antti Kivimäki
Available for | Technique description |
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General Users | High-resolution photoelectron and Auger electron spectroscopy of gaseous samples. (GPES) |
General Users | Ion time-of-flight mass spectrometry of gaseous samples. (GPES) |
General Users | X-Ray Absorption of gaseous samples, measured in the Total Ion Yield mode. (GPES) |
General Users | Photoelectron-photoion coincidence (PEPICO) spectroscopy of gaseous samples. (GPES) |
General Users | Negative-ion/positive-ion coincidence (NIPICO) spectroscopy of gaseous samples. (GPES) |
General Users | Measurement of photoluminescence emission spectra at fixed excitation energies in the wavelength range 200 - 1350 nm. (PLES) |
General Users | Measurement of photoluminescence excitation spectra at fixed emission wavelengths in photon energy range 4.55 - 1300 eV. (PLES) |
General Users | Time-resolved photoluminescence spectroscopy. (PLES) |
General Users | Temperature dependencies of luminescence properties of solid materials in the temperature range from 10 to 350 K. (PLES) |
General Users | Near edge X-ray absorption fine structure (NEXAFS), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES) |
General Users | X-ray/UV photoelectron spectroscopy (XPS/UPS), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES) |
General Users | Angle resolved photoelectron spectroscopy (ARPES), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES) |
FlexPES
Primary beamline contact: FlexPES contacts
Available for | Technique/facility description |
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General Users | Beamline: Linear horizontally polarized light from LPU, with energy range 40-1500 eV. Spot on sample both defocused (0.5-1.5 mm) and focused (from 50x15 um to 150x40 um in different end stations). |
General Users | Surface- and Material Science (SMS) branch: - High-resolution photoelectron spectroscopy (PES) on solid samples using DA30-L(W) analyzer and 4-axis manipulator; - X-ray absorption spectroscopy (XAS or NEXAFS) using total electron yield, partial electron yield and partial fluorescence yield (SDD detector); - Fast NEXAFS by continuous/non-stop scanning - Possibility to transfer samples in a vacuum suitcase from/to the off-line MAX IV STM lab (this option requires adding "SPM-lab" to your DUO proposal). |
General Users | Low Density Matter (LDM) branch: High-resolution PES on LDM samples using R4000 analyzer with the following sample delivery systems (samples must be approved by chemical safety group): - Liquid jet setup for e.g. aqueous solutions - Molecular jet source (continuous beam) for experiments on cold beams of atomic and molecular gases - Gas cell for PES experiments on atomic and molecular gases - Magnetron-based source for metal particle beams ICE end station: COLTRIMS/Multi-coincidence spectroscopy; to be used with molecular jet/cluster source (for details see ICE end station webpage in the MAX IV LDM webpages). |
General Users | Single Bunch Mode: One week of single-bunch operation available in the Fall 22 beamtime period. Please state clearly in your beamtime proposal if you are applying for beamtime during the available single bunch week! |
ForMAX
Primary beamline contact: Kim Nygård
Available for | Technique description |
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Commissioning experts | Full-field microtomography, without beam-expanding optics based on CRLs. |
Commissioning experts | Small- and/or wide-angle x-ray scattering (SWAXS). |
Commissioning experts | Scanning SWAXS imaging, without microfocusing optics based on CRLs. |
Commissioning experts | Combined full-field microtomography and SWAXS. |
HIPPIE
Primary beamline contact: Andrey Shavorskiy
Available for | Technique description |
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General Users | Catalysis Cell - Allows APXPS of a solid-gas interface, typically up to 10 mbar. Used for catalysis and surface science experiments - Possibility to transfer samples in a vacuum suitcase to/from the offline STM in the SPM lab at MAX IV (this option requires adding “SPM-lab” as a second beamline to your proposal) |
General Users | PM-IRRAS Allows APXPS and FTIR on the same spot. Used for catalysis and surface science experiments |
General Users | Liquid/Electrochemistry Cell Allows APXPS of a solid-liquid (dip-and-pull setup) and gas-liquid (liquid jet setup) interfaces up to 30 mbar for electrochemistry, energy, environmental, and atmospheric science experiments. |
MAXPEEM
Primary beamline contact: Alexei Zakharov
Available for | Technique description |
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General Users | SPELEEM in the soft X-ray range |
MicroMAX
Primary beamline contact: Thomas Ursby
Available for | Technique description |
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General Users | Rotational crystallography, monochromatic beam, fixed energy, sample changer |
Commissioning Experts | Serial crystallography, time-resolved experiments, monochromatic or wide bandwidth |
NanoMAX
Primary beamline contact: Alexander Björling (coherence and diffraction), Ulf Johansson (X-Ray Fluorescence)
Available for | Technique description |
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General Users | Scanning X-ray diffraction and coherent imaging in the Bragg geometry |
General Users | Forward ptychography and CDI |
General Users | X-Ray Fluorescence mapping in 2D |
General Users | Ptycho-tomography (at baseline capacity, contact beamline staff when applying). |
General Users | X-ray fluorescence tomography (at baseline capacity, contact beamline staff when applying). |
Training & Education | Applications of the above techniques to a model system provided by the applicant |
SoftiMAX
Primary beamline contact: SoftiMAX contacts
Available for | Technique description |
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General Users | STXM at absorption edges between photon energies 275 eV and 1600 eV, with spatial resolution between 22-60 nm, depending on energy range and sample properties. |
General Users | Ptychography at absorption edges between photon energies 700 eV and 1600 eV, with illumination spot size between 22-60 nm in focus, depending on energy range and sample properties. The Andor Zyla detector is availabe in this call. |
General Users | Circularly polarized x-rays in both helicities are available in addition to the default linear horizontal polarization in STXM and Ptychography modes. Restrictions apply; Please contact beamline staff if you intend to use circular polarization. |
Commissioning Users | STXM, Ptychography and X-ray Fluorescence imaging (XRF) at absorption edges between 1.6-2.5 keV, with illumination spot size of about 60 nm (resolution limit in STXM and XRF modes). |
SPECIES
Primary beamline contact: Species contacts
Available for | Technique description |
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General users | APXPS using the standard cell Available for APXPS experiments up to 20 mbar. Used for catalysis, redox studies, and different surface science experiments. |
General users | APXPS using the ALD cell Available for in-situ and operando ALD experiments for pressures up to 20 mbar. |
General users | RIXS using the GRACE spectrometer Emission energy range 50-650 eV, only linear polarization horizontally and vertically. Solid samples only. LN2-sample cooling available, 4-axis manipulator. |
SPM-lab
Primary beamline contact: Nikolay Vinogradov
Available for | Technique description |
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General Users, preferably in combination with a beamline proposal in research area spectroscopy | Scanning Tunneling Microscopy/Spectroscopy (STM/STS), dynamic STM with QPlus sensor, UHV. W or Pt/Ir(STM only) probes |
General Users, preferably in combination with a beamline proposal in research area spectroscopy | Non-contact Atomic Force Microscopy (NC-AFM) with QPlus sensor, force curves, UHV |
General Users, preferably in combination with a beamline proposal in research area spectroscopy | "Conventional" Atomic Force Microscopy (AFM) contact/tappng mode, in air |
General Users, preferably in combination with a beamline proposal in research area spectroscopy | Scanning Electron Microscopy (SEM) at NanoMAX beamline |
Veritas
Primary beamline contact: Conny Såthe
Available for | Technique description |
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General Users | Veritas A (Mid range performance RIXS, solid samples, LN2 cooled samples, linear polarization (horizontal and vertical), XAS (MCP and photo diode)), sample scanning |
General Users | Veritas B (Open port), contact beamline for specific information |